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- Titel:
Reliability Analysis of Analog Circuits by Lifetime Yield Prediction Using Worst-Case Distance Degradation Rate
- Autor(en):
- Pan, Xin; Graeb, Helmut
- Kongress- / Buchtitel:
- IEEE International Symposium on Quality Electronic Design (ISQED)
- Jahr:
- 2010
- Monat:
- mar
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