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- Titel:
A Compact Model of Negative Bias Temperature Instability Suitable for Gate-Level Circuit Simulation
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Liu, Xu; Zhou, Xing; Bernardini, Alessandro; Schlichtmann, Ulf
- Kongress- / Buchtitel:
- IEEE International Symposium on Quality Electronic Design (ISQED)
- Jahr:
- 2019
- Monat:
- March
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