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- Titel:
A Compact Model for NBTI Degradation and Recovery under Use-Profile Variations and its Application to Aging Analysis of Digital Integrated Circuits
- Autor(en):
- Kleeberger, Veit B.; Barke, Martin; Werner, Christoph; Schmitt-Landsiedel, Doris; Schlichtmann, Ulf
- Zeitschriftentitel:
- Microelectronics Reliability
- Jahr:
- 2014
- Band / Volume:
- 54
- Monat:
- jun
- Heft / Issue:
- 6-7
- Seitenangaben Beitrag:
- 1083-1089
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