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Document type:
Konferenzbeitrag 
Contribution type:
Vortrag / Präsentation 
Author(s):
Nyberg, Ralph and Nolles, Jürgen and Heyszl, Johann and Rabe, Dirk and Sigl, Georg 
Title:
Closing the Gap Between Speed and Configurability of Multi-Bit Fault Emulation Environments for Security and Safety-Critical Designs 
Abstract:
Steadily decreasing transistor sizes and new multi beam laser attacks lead to an increasing amount of multi-bit fault occurrences, e.g., during fault attacks against cryptographic implementations. Therefore, multi-bit fault injection becomes more important during security and safety verification. Fault injection techniques which are applicable during the development cycle of a device are based on either software implementations, e.g. formal methods and simulations, or fault emulation environm...    »
 
Dewey Decimal Classification:
620 Ingenieurwissenschaften 
Book / Congress title:
EUROMICRO Conference on Digital System Design (DSD) 
Congress (additional information):
Verona, Italien 
Year:
2014 
Quarter:
3. Quartal 
Year / month:
2014-08 
Month:
Aug 
Reviewed:
ja 
Language:
en