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- Titel:
Robustness Validation of Integrated Circuits and Systems
- Autor(en):
- Barke, Martin; Kärgel, Michael; Lu, Weiyun; Salfelder, Felix; Hedrich, Lars; Olbrich, Markus; Radetzki, Martin; Schlichtmann, Ulf
- Kongress- / Buchtitel:
- Asia Symposium on Quality Electronic Design (ASQED)
- Jahr:
- 2012
- Monat:
- jul
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