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- Titel:
Reliability Analysis of Analog Circuits Using Quadratic Lifetime Worst-Case Distance Prediction
- Dokumenttyp:
- Poster Paper
- Autor(en):
- Pan, Xin; Graeb, Helmut
- Kongress- / Buchtitel:
- IEEE Custom Integrated Circuits Conference (CICC)
- Jahr:
- 2010
- Monat:
- sep
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