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- Title:
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip
- Document type:
- Konferenzbeitrag
- Author(s):
- Angione, F.; Appello, D.; Athavale, J.; Bellarmino, Nicolò; Bernardi, P.; Cantoro, Riccardo; Sio, C. De; Foscale, T.; Gavarini, G.; Huch, Martin; Iaria, G.; Kilian, Tobias; Mariani, R.; Martone, Raffaele; Ruospo, A.; Sanchez, E.; Schlichtmann, Ulf; Squillero, Giovanni; Reorda, Matteo Sonza; Sterpone, Luca; Tancorre, V.; Ugioli, R.
- Book / Congress title:
- IEEE European Test Symposium ETS
- Year:
- 2022
- Month:
- May
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