Recovery of 2D and 3D Layout Information through an Advanced Image Stitching Algorithm using Scanning Electron Microscope Images

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Title:: Recovery of 2D and 3D Layout Information through an Advanced Image Stitching Algorithm using Scanning Electron Microscope Images
Document type:: Konferenzbeitrag
Author(s):: Singla, Aayush; Lippmann, Bernhard; Graeb, Helmut
Book / Congress title:: International Conference on Pattern Recognition (ICPR)
Year:: 2021
Month:: January
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