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Title:

Phase interferometric particle imaging for simultaneous measurements of evaporating micron-sized droplet and nanoscale size changes

Document type:
Zeitschriftenaufsatz
Author(s):
Wu, Yingchun; Li, Haipeng; Brunel, Marc; Chen, Jia; Gréhan, Gérard; Mädler, Lutz
Journal title:
Applied Physics Letters
Year:
2017
Journal volume:
111
Journal issue:
4
Pages contribution:
041905
Fulltext / DOI:
doi:10.1063/1.4996363
Publisher:
AIP Publishing
E-ISSN:
0003-69511077-3118
Date of publication:
24.07.2017
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