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- Title:
EffiTest2: Efficient Delay Test and Prediction for Post-Silicon Clock Skew Configuration under Process Variations
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Zhang, Li; Li, Bing; Shi, Yiyu; Hu, Jiang; Schlichtmann, Ulf
- Journal title:
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Year:
- 2018
- Fulltext / DOI:
- doi:10.1109/TCAD.2018.2818713
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