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- Title:
From Process Variations to Reliability: A Survey of Timing of Digital Circuits in the Nanometer Era
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Li, Bing; Hashimoto, Masanori; Schlichtmann, Ulf
- Journal title:
- IPSJ Transactions on System LSI Design Methodology
- Year:
- 2018
- Journal volume:
- 11
- Month:
- feb
- Pages contribution:
- 2-15
- Fulltext / DOI:
- doi:10.2197/ipsjtsldm.11.2
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