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- Title:
Monitoring of Aging in Integrated Circuits by Identifying Possible Critical Paths
- Author(s):
- Lorenz, Dominik; Barke, Martin; Schlichtmann, Ulf
- Journal title:
- Microelectronics Reliability
- Year:
- 2014
- Journal volume:
- 54
- Month:
- jun
- Journal issue:
- 6-7
- Pages contribution:
- 1075-1082
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