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- Title:
Characterization of Standard Cells
- Author(s):
- Knoth, Christoph; Schlichtmann, Ulf
- Pages contribution:
- 93-106
- Chapter contribution:
- 4.1
- Editor:
- Dietrich, Manfred; Haase, Joachim
- Book title:
- Process Variations and Probabilistic Integrated Circuit Design
- Edition:
- first
- Publisher:
- Springer
- Year:
- 2012
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