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- Title:
Efficiently analyzing the impact of aging effects on large integrated circuits
- Author(s):
- Lorenz, Dominik; Barke, Martin; Schlichtmann, Ulf
- Journal title:
- Microelectronics Reliability
- Year:
- 2012
- Journal volume:
- 52
- Month:
- aug
- Journal issue:
- 8
- Pages contribution:
- 1546-1552
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