Lifetime Yield Optimization of Analog Circuits Considering Process Variations and Parameter Degradations

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Title:: Lifetime Yield Optimization of Analog Circuits Considering Process Variations and Parameter Degradations
Author(s):: Pan, Xin; Graeb, Helmut
Pages contribution:: 131-146
Chapter contribution:: 6
Editor:: Tlelo-Cuautle, Esteban
Book title:: Advances in Analog Circuits
Publisher:: InTech
Year:: 2011
Month:: feb
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