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- Autor(en):
- Pan, Xin; Graeb, Helmut
- Titel:
- Reliability Optimization of Analog Integrated Circuits Considering the Trade-off between Lifetime and Area
- Zeitschriftentitel:
- Microelectronics Reliability
- Jahr:
- 2012
- Band / Volume:
- 52
- Monat:
- aug
- Heft / Issue:
- 8
- Seitenangaben Beitrag:
- 1559-1564
- Verlag / Institution:
- Elsevier
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