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Titel:

Improving the Security of Scan Path Test using Differential Chains

Dokumenttyp:
Konferenzbeitrag
Art des Konferenzbeitrags:
Vortrag / Präsentation
Autor(en):
Manich, Salvador and Wamser, Markus and Sigl, Georg
Abstract:
In this paper we present a new scan-path structure in order to improve the security of systems including a scan-path, which normally introduces a security critical information channel into a design. With this new structure we maintain testability as in a scan design and security like in a design without scan path. The structure, named differential scan-path (DiSP), divides the internal state of the scan-path in two sections. During shifting out, only the subtraction of the two sections is provi...     »
Stichworte:
security, testability, scan-based attack, scanpath, smartcard, BILBO
Dewey-Dezimalklassifikation:
620 Ingenieurwissenschaften
Kongress- / Buchtitel:
TRUDEVICE 2013
Kongress / Zusatzinformationen:
Avignon, Frankreich
Jahr:
2013
Jahr / Monat:
2013-05
Monat:
May
Reviewed:
ja
Sprache:
en
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