- Dokumenttyp:
- Poster Paper
- Autor(en):
- Pan, Xin; Graeb, Helmut
- Titel:
- Reliability Analysis of Analog Circuits Using Quadratic Lifetime Worst-Case Distance Prediction
- Kongress- / Buchtitel:
- IEEE Custom Integrated Circuits Conference (CICC)
- Jahr:
- 2010
- Monat:
- sep
BibTeX