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Title:

Fault-Simulation-Based Flip-Flop Classification for Reverse Engineering

Document type:
Konferenzbeitrag
Author(s):
Mildner, Michael and Brunner, Michaela and Gruber, Michael and Baehr, Johanna and Sigl, Georg
Abstract:
This work outlines a crucial step in gate-level netlist reverse engineering: classifying control and data flip-flops (FFs) to discern control logic and data paths. Existing methods rely mainly on structural characteristics, which can have disavantages. Our work introduces a novel approach that classifies FFs based on observed characteristics after fault insertion and propagation. We develop three new classification methods for block cipher implementations, emphasizing their significance in syste...     »
Keywords:
Ciphers; Reverse engineering; Logic gates; Security; Flip-flops; Flip-Flop Classification; Fault Simulation; Block Cipher; Hardware Reverse Engineering
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Book / Congress title:
2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)
Congress (additional information):
Kielce, Poland
Date of congress:
03.04.-05.04.2024
Year:
2024
Quarter:
2. Quartal
Year / month:
2024-04
Month:
Apr
Pages:
53-56
Reviewed:
ja
Language:
en
Fulltext / DOI:
doi:10.1109/DDECS60919.2024.10508905
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