Schulz, Lukas;Ung, Kien Lam;Koutnik-Abele, Sarah;Stokes, David L;Pedersen, Bjørn Panyella;Hammes, Ulrich Z
Transport of herbicides by PIN-FORMED auxin transporters
bioRxiv
2024

Eichmeir, Philipp;Nachbagauer, Karin;Steiner, Wolfgang
The Use of Slack Variables in the Adjoint Method Handling Inequality Constraints in Optimal Control and the Application to Tumor Drug Dosage
Journal of Computational and Nonlinear Dynamics
2024
20
2

Tripp, Donovan P.;Kunze, Karl P.;Crabb, Michael G.;Prieto, Claudia;Neji, Radhouene;Botnar, René M.
Simultaneous 3D T1, T2, and fat-signal-fraction mapping with respiratory-motion correction for comprehensive liver tissue characterization at 0.55 T
Magnetic Resonance in Medicine
2024

Si, Dongyue;Crabb, Michael G.;Kunze, Karl P.;Littlewood, Simon J.;Prieto, Claudia;Botnar, René M.
Free‐breathing 3D whole‐heart joint T₁/T₂ mapping and water/fat imaging at 0.55 T
Magnetic Resonance in Medicine
2024
92
4
1511-1524

Genssler, Paul R.;Wasif, Sandy A.;Wael, Miran;Novkin, Rodion;Amrouch, Hussam
Frontiers in Edge AI with RISC-V: Quantized Neural Networks vs. Hyperdimensional Computing
Proceedings of the Conference on Design, Automation & Test in Europe (DATE'24)
2024

Jafarzadeh, Hanieh;Klemme, Florian;Amrouch, Hussam;Hellebrand, Sybille;Wunderlich, Hans-Joachim
Vmin Testing under Variations: Defect versus Fault Coverage
IEEE Latin American Test Symposium (LATS'24)
2024

Hien, Benjamin;Walter, Marcel;van Santen, Victor M.;Klemme, Florian;Parihar, Shivendra Singh;Pahwa, Girish;Chauhan, Yogesh S.;Amrouch, Hussam;Wille, Robert
Technology Mapping for Cryogenic CMOS Circuits
IEEE Computer Society Annual Symposium on VLSI (ISVLSI'24)
2024

Jafarzadeh, Hanieh;Klemme, Florian;Amrouch, Hussam;Hellebrand, Sybille;Wunderlich, Hans-Joachim
Time and Space Optimized Storage-based BIST under Multiple Voltages and Process Variations
IEEE European Test Symposium (ETS'24)
2024

Genssler, Paul;Mayahinia, Mahta;Thomann, Simon;Tahoori, Mehdi;Amrouch, Hussam
Technology/Algorithm Co-design for Reliable Energy-efficient NVM-based Hyperdimensional Computing under Voltage Scaling
Proceedings of the Conference on Design, Automation & Test in Europe (DATE'24)
2024

Jafarzadeh, Hanieh;Klemme, Florian;Dennis Reimer, Jan;Amrouch, Hussam;Hellebrand, Sybille;Wunderlich, Hans-Joachim
Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing
IEEE International Test Conference (ITC'24)
2024