Memory Utilization-Based Dynamic Bandwidth Regulation for Temporal Isolation in Multi-Cores
2022 IEEE 28th Real-Time and Embedded Technology and Applications Symposium (RTAS)
2022
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip
IEEE European Test Symposium ETS
2022
Application-aware aging analysis and mitigation for SRAM Design-for-Reliability
Microelectronics Reliability
2022
134
July
Contamination-Aware Synthesis for Programmable Microfluidic Devices
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)
2022
A Hierarchical Performance Equation Library for Basic Op-Amp Design
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2022
Training PPA Models for Embedded Memories On a Low Data Diet
ACM Transactions on Design Automation of Electronic Systems
2022
COMPAS: Compiler-assisted Software-implemented Hardware Fault Tolerance for RISC-V
Mediterranean Conference on Embedded Computing (MECO)
2022
Fast and Accurate Model-Driven FPGA-based System-Level Fault Emulation
International Conference on VLSI and System-on-Chip (VLSI-SoC)
2022
Design of a Tightly-Coupled RISC-V Physical Memory Protection Unit for Online Error Detection
International Conference on VLSI and System-on-Chip (VLSI-SoC)
2022