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Title:

Towards Fault Simulation at Mixed Register-Transfer/Gate-Level Models

Document type:
Konferenzbeitrag
Author(s):
Kaja, Endri; Gerlin, Nicolas; Vaddeboina, Mounika; Rivas, Luis; Prebeck, Sebastian Siegfried; Han, Zhao; Devarajegowda, Keerthikumara; Ecker, Wolfgang
Book / Congress title:
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Year:
2021
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