Recovery of 2D and 3D Layout Information through an Advanced Image Stitching Algorithm using Scanning Electron Microscope Images

Benutzer: Gast

Titel:: Recovery of 2D and 3D Layout Information through an Advanced Image Stitching Algorithm using Scanning Electron Microscope Images
Dokumenttyp:: Konferenzbeitrag
Autor(en):: Singla, Aayush; Lippmann, Bernhard; Graeb, Helmut
Kongress- / Buchtitel:: International Conference on Pattern Recognition (ICPR)
Jahr:: 2021
Monat:: January
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