A 30ns 16Mb 2b/cell Embedded Flash with Ramped Gate Time-Domain Sensing Scheme for Automotive Application

User: Guest

Title:: A 30ns 16Mb 2b/cell Embedded Flash with Ramped Gate Time-Domain Sensing Scheme for Automotive Application
Document type:: Konferenzbeitrag
Author(s):: Kiesel, Sebastian; Kern, Thomas; Wicht, Bernhard; Graeb, Helmut
Book / Congress title:: International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
Year:: 2019
Month:: April
BibTeX

Occurrences: