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Title:

Error Correction for Partially Stuck Memory Cells

Document type:
Konferenzbeitrag
Author(s):
Haider Al Kim, Sven Puchinger, and Antonia Wachter-Zeh
Keywords:
flash memories, phase change memories, (partially) stuck cells, error correction, defective cells, partitioned cyclic codes, BCH code.
Book / Congress title:
International Symposium on Problems of Redundancy in Information and Control Systems 2019, Moscow, Russia.
Publisher:
IEEE Xplore
Date of publication:
20.02.2020
Year:
2019
Year / month:
2019-10
Month:
Feb
Pages:
pp. 87-92
Covered by:
Scopus
Fulltext / DOI:
doi:10.1109/REDUNDANCY48165.2019.9003352
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