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Titel:

Locked out by Latch-up? An Empirical Study on Laser Fault Injection into Arm Cortex-M Processors

Dokumenttyp:
Konferenzbeitrag
Art des Konferenzbeitrags:
Vortrag / Präsentation
Autor(en):
Selmke, Bodo and Zinnecker, Kilian and Koppermann, Philipp and Miller, Katja and Heyszl, Johann and Sigl, Georg
Abstract:
Laser-based fault injection (LFI) is considered as one of the most powerful tools for active attacks against integrated circuits. However, only few empirical results are published for LFI into modern low-power microcontrollers with current process technologies. To fill this gap, we investigate LFI in four Cortex-M microcontrollers from different manufacturers: ST Microelectronics, NXP and Infineon. We note that those controllers differ from the ones used in high-security smartcard devices bu...     »
Stichworte:
Laser fault injection, Latch-up, Cortex-M
Dewey-Dezimalklassifikation:
620 Ingenieurwissenschaften
Kongress- / Buchtitel:
2018 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2018, Amsterdam, The Netherlands, September 13, 2018
Kongress / Zusatzinformationen:
Amsterdam, The Netherlands
Datum der Konferenz:
13.09.2018
Jahr:
2018
Quartal:
3. Quartal
Jahr / Monat:
2018-09
Monat:
Sep
Seiten:
7--14
Volltext / DOI:
doi:10.1109/FDTC.2018.00010
WWW:
https://doi.org/10.1109/FDTC.2018.00010
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