Login
- Title:
A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs
- Author(s):
- Li, Tianjian; Xie, Feng; Liang, Xiaoyao; Xu, Qiang; Chakrabarty, Krishnendu; Jing, Naifeng; Jiang, Li
- Journal title:
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Year:
- 2016
- Journal volume:
- 35
- Journal issue:
- 7
- Pages contribution:
- 1192-1205
- Fulltext / DOI:
- doi:10.1109/tcad.2015.2512909
- Publisher:
- Institute of Electrical and Electronics Engineers (IEEE)
- E-ISSN:
- 0278-00701937-4151
- Date of publication:
- 01.07.2016
BibTeX