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- Titel:
A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs
- Autor(en):
- Li, Tianjian; Xie, Feng; Liang, Xiaoyao; Xu, Qiang; Chakrabarty, Krishnendu; Jing, Naifeng; Jiang, Li
- Zeitschriftentitel:
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Jahr:
- 2016
- Band / Volume:
- 35
- Heft / Issue:
- 7
- Seitenangaben Beitrag:
- 1192-1205
- Volltext / DOI:
- doi:10.1109/tcad.2015.2512909
- Verlag / Institution:
- Institute of Electrical and Electronics Engineers (IEEE)
- E-ISSN:
- 0278-00701937-4151
- Publikationsdatum:
- 01.07.2016
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