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- Title:
Robustness Measurement of Integrated Circuits and its Adaptation to Aging Effects
- Author(s):
- Barke, Martin; Kaergel, Michael; Olbrich, Markus; Schlichtmann, Ulf
- Journal title:
- Microelectronics Reliability
- Year:
- 2014
- Journal volume:
- 54
- Month:
- jun
- Journal issue:
- 6-7
- Pages contribution:
- 1058-1065
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