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- Titel:
Robustness Measurement of Integrated Circuits and its Adaptation to Aging Effects
- Autor(en):
- Barke, Martin; Kaergel, Michael; Olbrich, Markus; Schlichtmann, Ulf
- Zeitschriftentitel:
- Microelectronics Reliability
- Jahr:
- 2014
- Band / Volume:
- 54
- Monat:
- jun
- Heft / Issue:
- 6-7
- Seitenangaben Beitrag:
- 1058-1065
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