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- Title:
Resilience Articulation Point (RAP): Cross-layer Dependability Modeling for Nanometer System-on-chip Resilience
- Author(s):
- Herkersdorf, Andreas; Aliee, Hananeh; Engel, Michael; Glaß, Michael; Gimmler-Dumont, Christina; Henkel, Jörg; Kleeberger, Veit B.; Kochte, Michael A.; Kühn, Johannes M.; Mueller-Gritschneder, Daniel; Nassif, Sani R.; Rauchfuss, Holm; Rosenstiel, Wolfgang; Schlichtmann, Ulf; Shafique, Muhammad; Tahoori, Mehdi B.; Teich, Jürgen; Wehn, Norbert; Weis, Christian; Wunderlich, Hans-Joachim
- Journal title:
- Microelectronics Reliability
- Year:
- 2014
- Journal volume:
- 54
- Month:
- jun
- Journal issue:
- 6-7
- Pages contribution:
- 1066-1074
BibTeX