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- Title:
A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience
- Author(s):
- Kleeberger, Veit B.; Gimmler-Dumont, Christina; Weis, Christian; Herkersdorf, Andreas; Mueller-Gritschneder, Daniel; Nassif, Sani R.; Schlichtmann, Ulf; Wehn, Norbert
- Journal title:
- IEEE Micro
- Year:
- 2013
- Journal volume:
- 33
- Month:
- jul
- Journal issue:
- 4
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