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- Title:
Reliability Optimization of Analog Integrated Circuits Considering the Trade-off between Lifetime and Area
- Author(s):
- Pan, Xin; Graeb, Helmut
- Journal title:
- Microelectronics Reliability
- Year:
- 2012
- Journal volume:
- 52
- Month:
- aug
- Journal issue:
- 8
- Pages contribution:
- 1559-1564
- Publisher:
- Elsevier
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