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Document type:
Zeitschriftenaufsatz 
Author(s):
Manich, Salvador and Strasser, Martin 
Title:
A Highly Time Sensitive XOR Gate for Probe Attempt Detectors 
Abstract:
Probe attempt detectors are sensors designed to protect buses of secure chips against the physical contact of probes. The operation principle of these detectors relies on the comparison of the delay propagation times between lines. CMOS XOR gates are very well suited for this comparison since they are small, fast, and compatible with the technology used in secure chips. However, the lack of activity while comparing matched lines and the limited reaction time pose a risk for tampering and dec...    »
 
Keywords:
CMOS integrated circuits, logic gates, phase detection, smart cards 
Journal title:
Circuits and Systems II: Express Briefs, IEEE Transactions on 
Year:
2013 
Year / month:
2013-11 
Month:
Nov 
Pages contribution:
786 - 790 
Reviewed:
ja 
Language:
en 
Publisher:
IEEE 
E-ISSN:
1549-7747