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Title:

Differential Scan-Path: A Novel Solution for Secure Design-for-Testability

Document type:
Konferenzbeitrag
Contribution type:
Vortrag / Präsentation
Author(s):
Manich, Salvador and Wamser, Markus Guillen, Oscar and Sigl, Georg
Abstract:
In this paper, we present a new scan-path structure for improving the security of systems including scan paths, which normally introduce a security critical information leak channel into a design. Our structure, named differential scan path (DiSP), divides the internal state of the scan path in two sections. During the shift-out operation, only subtraction of the two sections is provided. Inferring the internal state from this subtraction requires much guesswork that increases exponen-tially wit...     »
Keywords:
security, testability, scan path, attack, BILBO
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Book / Congress title:
Test Conference (ITC), 2013 IEEE International
Congress (additional information):
Anaheim, USA
Publisher:
IEEE
Year:
2013
Year / month:
2013-09
Month:
Sep
Pages:
1 - 9
Print-ISBN:
1089-3539
Reviewed:
ja
Language:
en
Fulltext / DOI:
doi:10.1109/TEST.2013.6651902
WWW:
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6651902
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