In-Memory Acceleration of Hyperdimensional Genome Matching on Unreliable Emerging Technologies
IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I)
2024
Monolithic 3D Integration using BEOL FeFET: Reliability, Thermal Effects, and DNN Accuracy
IEEE Electron Devices Technology & Manufacturing Conference (EDTM'24)
2024
Monolithic 3D Integration using BEOL FeFET: Reliability, Thermal Effects, and DNN Accuracy
IEEE Electron Devices Technology & Manufacturing Conference (EDTM'24)
2024
Monolithic 3D Integration using BEOL FeFET: Reliability, Thermal Effects, and DNN Accuracy
IEEE Electron Devices Technology & Manufacturing Conference (EDTM'24)
2024
Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor
Proceedings of the IEEE 62nd International Reliability Physics Symposium (IRPS'24)
2024
On the Severity of Self-Heating in FDSOI at Cryogenic Temperatures: In-depth analysis from Transistors to Full Processor
Proceedings of the IEEE 62nd International Reliability Physics Symposium (IRPS'24)
2024
Impact of Self-Heating in 5 nm FinFETs at Cryogenic Temperatures for Reliable Quantum Computing: Device-Circuit Interaction
Proceedings of the IEEE 62nd International Reliability Physics Symposium (IRPS'24)
2024
Algorithm to Technology Co-Optimization for CiM-based Hyperdimensional Computing
Proceedings of the Conference on Design, Automation & Test in Europe (DATE)
2024
Algorithm to Technology Co-Optimization for CiM-based Hyperdimensional Computing
Proceedings of the Conference on Design, Automation & Test in Europe (DATE)
2024
Low Power and Temperature-Resilient Compute-In-Memory Based on Subthreshold-FeFET
Proceedings of the Conference on Design, Automation & Test in Europe (DATE)
2024