Soft-Error Analysis of RRAM 1T1R Compute-In-Memory Core for Artificial Neural Networks

Title:: Soft-Error Analysis of RRAM 1T1R Compute-In-Memory Core for Artificial Neural Networks
Document type:: Konferenzbeitrag
Author(s):: Jia, Ruolan; Pechmann, Stefan; Markus, Fritscher; Wenger, Christian; Zhang, Lei; Hagelauer, Amelie
Keywords:: Fabrication; Degradation; Analytical models; Accuracy; Computational modeling; Artificial neural networks; In-memory computing; Transistors; Photoconductivity; Logic; RRAM; IT1R; Single Effect Upsets; Modeling; Radiation Hardening; RHBD; MAC; Compute-In-Memory
Book / Congress title:: 2024 39th Conference on Design of Circuits and Integrated Systems (DCIS)
Year:: 2024
Pages:: 1-5
Fulltext / DOI:: doi:10.1109/DCIS62603.2024.10769203
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