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Titel:

Soft-Error Analysis of RRAM 1T1R Compute-In-Memory Core for Artificial Neural Networks

Dokumenttyp:
Konferenzbeitrag
Autor(en):
Jia, Ruolan; Pechmann, Stefan; Markus, Fritscher; Wenger, Christian; Zhang, Lei; Hagelauer, Amelie
Stichworte:
Fabrication; Degradation; Analytical models; Accuracy; Computational modeling; Artificial neural networks; In-memory computing; Transistors; Photoconductivity; Logic; RRAM; IT1R; Single Effect Upsets; Modeling; Radiation Hardening; RHBD; MAC; Compute-In-Memory
Kongress- / Buchtitel:
2024 39th Conference on Design of Circuits and Integrated Systems (DCIS)
Jahr:
2024
Seiten:
1-5
Volltext / DOI:
doi:10.1109/DCIS62603.2024.10769203
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