Login
- Titel:
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors
- Dokumenttyp:
- Konferenzbeitrag
- Autor(en):
- Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos I.; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Rizi, Mahnaz Namazi; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; Reorda, Matteo Sonza; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidarič, Nuša
- Kongress- / Buchtitel:
- 2023 IEEE European Test Symposium (ETS)
- Verlag / Institution:
- IEEE
- Publikationsdatum:
- 22.05.2023
- Jahr:
- 2023
- Volltext / DOI:
- doi:10.1109/ets56758.2023.10174099
BibTeX