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Title:

Structured Design and Evaluation of a Resistor-Based PUF Robust Against PVT-Variations

Document type:
Konferenzbeitrag
Author(s):
Riehm, Carl; Frisch, Christoph; Burcea, Florin; Hiller, Matthias; Pehl, Michael; Brederlow, Ralf
Book / Congress title:
2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Publisher:
IEEE
Date of publication:
03.05.2023
Year:
2023
Fulltext / DOI:
doi:10.1109/ddecs57882.2023.10139352
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