Genssler, Paul R.;Thomann, Simon;Amrouch, Hussam
Tutorial: The Synergy of Hyperdimensional and In-memory Computing
International Conference on Hardware/Software Codesign and System Synthesis (CODES/ISSS )
2023

Hu, Yuting;Li, Jiajie;Klemme, Florian;Nam, Gi-Joon;Ma, Tengfei;Amrouch, Hussam;Xiong, Jinjun
SyncTREE: Fast Timing Analysis for Integrated Circuit Design through a Physics-informed Tree-based Graph Neural Network
Thirty-seventh Conference on Neural Information Processing Systems (NeurIPS)
2023

Abdulrahman, Maram;Wasif, Sandy;Wael, Miran;Azab, Eman;Abd El, Mohamed;Mashaly, Maggie;mohamed, Abdel Ghany;Amrouch, Hussam
A Review on Hyperdimensional Computing
Proceedings of the IEEE International Conference on Mechatronics (ICM)
2023

Novkin, Rodion;Amrouch, Hussam;Klemme, Florian
Approximation-Aware and Quantization-Aware Training for Graph Neural Networks
IEEE Transactions on Computers (TC)
2023
09

Kumar, Shubham;Chauhan S., Yogesh;Amrouch, Hussam
Ultra-Efficient Edge AI using FeFET-based Monolithic 3D Integration
IEEE/ACM 42nd International Conference on Computer-Aided Design (ICCAD)
2023

Errahmouni Barkam, Hamza;Yun, Sanggeon;Chen, Hanning;Genssler, Paul;Mema, Albi;Ding, Andrew;Michelogiannakis, George;Amrouch, Hussam;Imani, Mohsen
Reliable Hyperdimensional Reasoning on Unreliable Emerging Technologies
IEEE/ACM 42nd International Conference on Computer-Aided Design (ICCAD)
2023

Yun, Sanggeon;Errahmouni Barkam, Hamza;Latapie, Hugo;Genssler, Paul R.;Amrouch, Hussam;Imani, Mohsen
Hyperdimensional Computing for Robust and Efficient Unsupervised Learning
57th Asilomar Conference on Signals, Systems, and Computers, (Asilomar)
2023

van Santen, Victor;Klemme, Florian;Genssler, Paul;Amrouch, Hussam
Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
2023

Jafarzadeh, Hanieh;Klemme, Florian;Dennis Reimer, Jan;Paria Najafi Haghi, Zahra;Amrouch, Hussam;Hellebrand, Sybille;Wunderlich, Hans-Joachim
Robust Pattern Generation for Small Delay Faults under Process Variations
IEEE International Test Conference (ITC)
2023

Thapar, Dhruv;Thomann, Simon;Arjun, Chaudhuri;Amrouch, Hussam;Chakrabarty, Krishnendu
Analysis and Characterization of Defects in FeFETs
IEEE International Test Conference (ITC)
2023