Kolb, Nicola;Schmidt, Tabea;Fröhlich, Joachim;Pretschner, Alexander
When to Apply Scenario-Based Testing to a New System Domain?
2023 IEEE 26th International Conference on Intelligent Transportation Systems (ITSC)
IEEE
2023

Hutzelmann, Thomas;Mauksch, Dominik;Petrovska, Ana;Pretschner, Alexander
Generation of Tailored and Confined Datasets for IDS Evaluation in Cyber-Physical Systems
IEEE Transactions on Dependable and Secure Computing
2023
1-15

Lamby, Metin; Zieglmeier, Valentin; Ziegler, Christian
Trusting a Smart Contract Means Trusting Its Owners: Understanding Centralization Risk
Proceedings of the 5th Conference on Blockchain Research & Applications for Innovative Networks and Services (BRAINS)
IEEE
2023

Zieglmeier, Valentin
The Inverse Transparency Toolchain: A Fully Integrated and Quickly Deployable Data Usage Logging Infrastructure
Software Impacts
2023
17
Sep
100554:1–4

Zander, Patrik; Zieglmeier, Valentin
Data Owner Benefit-Driven Design of People Analytics
Proceedings of the ACM on Human-Computer Interaction
2023
7
EICS
173:1–38

Lipp, Stephan; Elsner, Daniel; Kacianka, Severin; Pretschner, Alexander; Böhme, Marcel; Banescu, Sebastian
Green Fuzzing: A Saturation-based Stopping Criterion using Vulnerability Prediction
ACM SIGSOFT International Symposium on Software Testing and Analysis
Accepted for publication
2023

Zieglmeier, Valentin; Pretschner, Alexander
Rethinking People Analytics With Inverse Transparency by Design
Proceedings of the ACM on Human-Computer Interaction
2023
7
CSCW2
292:1–29

Zieglmeier, Valentin; Loyola Daiqui, Gabriel; Pretschner, Alexander
Decentralized Inverse Transparency With Blockchain
Distributed Ledger Technologies: Research and Practice
2023
2
3
17:1–28

Elsner, Daniel Valentin
Integrating System and Process Characteristics into Regression Test Optimization
2023
Dissertation
145 p.

Stöckle, Patrick;Sammereier, Michael;Grobauer, Bernd;Pretschner, Alexander
Better Safe Than Sorry! Automated Identification of Functionality-Breaking Security-Configuration Rules
10
ACM/IEEE International Conference on Automation of Software Test (AST)
2023