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- Document type:
- Konferenzbeitrag
- Contribution type:
- Poster
- Author(s):
- Barthel, L.; Schmideder, S.; Briesen, H.; Meyer, V.
- Title:
- An X-ray microtomography-based method for detailed analysis of the three-dimensional morphology of fungal pellets: Aspergillus niger as case study
- Book / Congress title:
- 13th Symposium of the VAAM Special Group -- Biology and Biotechnology of Fungi
- Publisher address:
- Göttingen, Germany
- Year:
- 2019
- TUM Institution:
- Process Systems Engineering, TUM
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