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Dokumenttyp:
Konferenzbeitrag
Art des Konferenzbeitrags:
Poster
Autor(en):
Barthel, L.; Schmideder, S.; Briesen, H.; Meyer, V.
Titel:
An X-ray microtomography-based method for detailed analysis of the three-dimensional morphology of fungal pellets: Aspergillus niger as case study
Kongress- / Buchtitel:
13th Symposium of the VAAM Special Group -- Biology and Biotechnology of Fungi
Verlagsort:
Göttingen, Germany
Jahr:
2019
TUM Einrichtung:
Process Systems Engineering, TUM
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