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Document type:
Konferenzbeitrag 
Contribution type:
Vortrag / Präsentation 
Author(s):
Künzig, T.; Schrag, G.; Iannacci, J. 
Title:
Modeling and simulation of an active restoring mechanism for high reliability switches in RF-MEMS technology 
Book / Congress title:
Proceedings of the 23rd European Sysmposium on Reliability of Electron Devices, Failure Physics and Analysis 
Congress (additional information):
ESREF2012, October 1-5, Cagliari, Italy 
Publisher:
Elsevier 
Publisher address:
Amsterdam 
Year:
2012 
Reviewed:
ja 
Language:
en