"Testing semiconductor devices at extremly high operating temperatures"
Microelectronics Reliability
2008
Vol 28, issues 8-9, special issue ESREF 2008
pp.1440-1443
"Testing semiconductor devices at extremly high operating temperatures"
Proceedings of the 19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF -
Sept. 29 to Oct. 2, 2008, Maastricht, The Netherlands
2008
"The Minimal Set of Parameters for Exact Dynamic Thermal Models"
pp.70-75
Proceedings of the 14th International Workshop on THERMal INvestigation of ICs and Systems - THERMINIC
Sept. 24-26, 2008, Rome, Italy
2008
"Laser Deflection Measurement for the Determination of Temperature and Charge Carrier Distributions in 4H-SiC Power Diodes"
pp. 267-270
7th European Conference on Silicon Carbide and Related Materials -ECSCRM 2008
Sept. 7-11, 2008, Barcelona, Spain
2008
"Zerstörung im aktiven Teil eines IGBT-Chips ausgelöst durch Avalanche-Durchbruch am Randabschluss"
37. Kolloquium "Halbleiter-Leistungsbauelemente und ihre systemtechnische Anwendung"
27.10.2008-28.10.2008, Freiburg i. B.
2008
"Hochtemperaturmessungen mit kurzen Pulsen"
37. Kolloquium "Halbleiter-Leistungsbauelemente und ihre systemtechnische Anwendung"
27.10.2008-28.10.2008, Freiburg i. B.
2008
"Strahlungsbedingte Ausfälle des Logikteils von HV-ICs in CMOS-Technologie"
37. Kolloquium "Halbleiter-Leistungsbauelemente und ihre systemtechnische Anwendung"
27.10.2008-28.10.2008, Freiburg i. B.
2008
A Novel Piezoelectric Actuator with a Double Concentric Electrode Structure
pp. 205-208
Technical Digest of the 19th MicroMechanics Europe Workshop - MME2008
28.09.2008 -30.09.2008, Aachen, Germany
2008
Power Efficient Circuit Concepts for Piezoelectrically Driven Microactuators
pp. 61-64
Technical Digest of the 19th MicroMechanics Europe Workshop - MME2008
28.09.2008 -30.09.2008, Aachen, Germany
2008
Destruction in the Active Part of an IGBT Chip Caused by Avalanche-Breakdown at the Edge Termination Structure,
pp.159-162
7th International Conference on Advanced Semiconductor Devices and Microsystems - ASDAM ´08
12.10.2008 - 16.10.2008, Smolenice Castle, Slovakia
2008