Malik, P.; Gupta, H.; Ghosh, S.; Srivastava, P..Study of Optical Properties of Single and Double Layered Amorphous Silicon Nitride Films for Photovoltaics Applications.Silicon 2022-07.2022.Jul

Dlugosch, M.; Seim, H.; Bora, A.; Kamiyama, T.; Lieberman, I.; May, F.; Müller-Plathe, F.; Nefedov, A.; Prasad, S.; Resch, S.; Saller, K.; Seim, C.; Speckbacher, M.; Voges, F.; Tornow, M.; Kirsch, P..Conductance Switching in Liquid Crystal-Inspired Self-Assembled Monolayer Junctions.ACS Appl. Mater. Interfaces XXXX, XXX, XXX-XXX 2022-07.2022.Jul

Kirsch, P.; Qiong, T.; Ruhl, A.; Tornow, M.; Bora, A..Electronic component including molecular layer

Kirsch, P.; Ruhl, A.; Tornow, M.; Bora, A..Electronic switching element

Kirsch, P.; Resch, S.; Seim, H.; Tornow, M.; Kamiyama, T.; Roeschenthaler, G.-V.; Pajkert, R.; Merck Performance Materials GmbH. Method for producing an electronic component which includes a self-assembled monolayer

Kirsch, P.; Ruhl, A.; Tornow, M.; Bora, A.; Merck Patent GmbH.Electronic switching element

Bartl, J.D.; Scarbolo, P.; Brandalise, D.; Stutzmann, M.; Tornow, M.; Selmi, L.; Cattani-Scholz, A..Morphological and electrochemical properties of different PNA-based sensing platforms – Impact of the receptor-surface binding modes.CeNS Workshop 2018 "Celebrating NanoScience" .Venice, Italy, 24-28 Sep 2018-09.2018

Bartl, J.D.; Scarbolo, P.; Gremm, O.S.; Rziga, G.; Stutzmann, M.; Tornow, M.; Selmi, L.; Cattani-Scholz, A..Impact of different receptor binding modes on surface morphology and electrochemical properties of PNA-based sensing platforms.AVS International Symposium & Exhibition.Los Angeles CA USA, 21-26 Oct 2018-10.2018

Rinderle, M.; Speckbacher, M.; Tornow, M.; Gagliardi, A..A kinetic Monte Carlo simulation of filament formation in memristive devices . European Materials Research Society Spring Meeting, Poster AA.P.44,.Nice, France, 27-31 May 2019-05.2019

Speckbacher, M.; Ji, X.; Tornow, M..Resistive Switching in Single Core-Shell Nanoparticles.IEEE 19th International Conference on Nanotechnology (IEEE-NANO).Macao, China, 22-26 July 2019-07.IEEE Digital Explorer.2019