Weiss, Chr.; Wachutka, G.; Härtl, A.; Hille, F.; Pfirsch, F.Predictive Physical Model of Cosmic-Radiation-Induced Failures of Power DevicesProceedings of the 15th International Power Electronics and Motion Control Conference, EPE-PEMC 2012 ECCE EuropeSeptember, 4-6, Novi Sad, Serbia2012
Gerstenmaier, Y. C.; Wachutka, G.Unified theory for inhomogeneous thermoelectric generators and coolers including multistage devicesPhysical Review E2012E 86, 0567031-10
Weiß, C.; Härtl, A.; Hille, F.; Pfirsch, F.; Wachutka, G.Höhenstrahlungsresistenz von Silizium-Leistungsdioden41. Kolloquium Halbleiter-Leistungsbauelemente und ihre systemtechnische Anwendung29. - 30. Oktober 2012, Freiburg i.B., Germany2012
Weiß, C.; Wachutka, G.Destructive Effects in Silicon Power Devices After the Impact of a Cosmic Particlepp. 49-52Proceedings of the 11th International Seminar on Power SemiconductorsISPS 2012, August 29-31, Prague, Czech Republic2012
Weiß, C.; Wachutka, G.A numerical "a-posteriori"-Method to Calculate Local Self-Heating in Power Devices after the Impact of a Cosmic Particlepp. 35-38Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices SISPAD 2012, September 5-7, Denver, CO, USA2012
Oberndörfer, J.; Schrag, G.; Wachutka, G.Efficient model for predictive MEMS microphone design: Model derivation and experimental verificationProceedings of the EUROSENSORS XXVIEUROSENSORS 2012, September 9-12, Krakow, PolandElsevier2012
Niessner, M.; Schrag, G.; Iannacci, J.; Wachutka, G.Squeeze-Film Damping in Perforated Microstructures: Modeling, Simulation and Pressure-Dependent Experimental Validationpp. 598-601Proceedings of the Nanotech - NSTI 2012- Vol. 2June 18-21, Santa Clara, CA, USA2012
Künzig, T.; Schrag, G.; Iannacci, J.; Wachutka, G.Improving the reliability of electrostatically actuated RF-MEMS switches: FEM simulations and measurements on a thermal recovery mechanismpp 340-345Proceedings of the 13th Mechatronics Forum - International ConferenceMechatronics 2012, Sept. 17-19, Linz, Austria2012
Künzig, T.; Schrag, G.; Iannacci, J.Modeling and simulation of an active restoring mechanism for high reliability switches in RF-MEMS technologyProceedings of the 23rd European Sysmposium on Reliability of Electron Devices, Failure Physics and AnalysisESREF2012, October 1-5, Cagliari, ItalyElsevier2012
Künzig, T.; Iannacci, J.; Schrag, G.; Wachutka, G.Study of an active thermal recovery mechanism for an electrostatically actuated RF-MEMS switchProceedings of the 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and MicrosystemsEuroSime 2012, April, 16-18, Cascais, PortugalIEEE2012