Predictive Physical Model of Cosmic-Radiation-Induced Failures of Power Devices
Proceedings of the 15th International Power Electronics and Motion Control Conference, EPE-PEMC 2012 ECCE Europe
September, 4-6, Novi Sad, Serbia
2012
Unified theory for inhomogeneous thermoelectric generators and coolers including multistage devices
Physical Review E
2012
E 86, 056703
1-10
Höhenstrahlungsresistenz von Silizium-Leistungsdioden
41. Kolloquium Halbleiter-Leistungsbauelemente und ihre systemtechnische Anwendung
29. - 30. Oktober 2012, Freiburg i.B., Germany
2012
Destructive Effects in Silicon Power Devices After the Impact of a Cosmic Particle
pp. 49-52
Proceedings of the 11th International Seminar on Power Semiconductors
ISPS 2012, August 29-31, Prague, Czech Republic
2012
A numerical "a-posteriori"-Method to Calculate Local Self-Heating in Power Devices after the Impact of a Cosmic Particle
pp. 35-38
Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices
SISPAD 2012, September 5-7, Denver, CO, USA
2012
Efficient model for predictive MEMS microphone design: Model derivation and experimental verification
Proceedings of the EUROSENSORS XXVI
EUROSENSORS 2012, September 9-12, Krakow, Poland
Elsevier
2012
Squeeze-Film Damping in Perforated Microstructures: Modeling, Simulation and Pressure-Dependent Experimental Validation
pp. 598-601
Proceedings of the Nanotech - NSTI 2012- Vol. 2
June 18-21, Santa Clara, CA, USA
2012
Improving the reliability of electrostatically actuated RF-MEMS switches: FEM simulations and measurements on a thermal recovery mechanism
pp 340-345
Proceedings of the 13th Mechatronics Forum - International Conference
Mechatronics 2012, Sept. 17-19, Linz, Austria
2012
Modeling and simulation of an active restoring mechanism for high reliability switches in RF-MEMS technology
Proceedings of the 23rd European Sysmposium on Reliability of Electron Devices, Failure Physics and Analysis
ESREF2012, October 1-5, Cagliari, Italy
Elsevier
2012
Study of an active thermal recovery mechanism for an electrostatically actuated RF-MEMS switch
Proceedings of the 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems
EuroSime 2012, April, 16-18, Cascais, Portugal
IEEE
2012