Concept: Minimization of Testing Effort at Battery System Level by Simulation

Battery aging depends significantly on the operating conditions. Since these differ from cell to cell in connected systems, examining aging at the cell level is not sufficient. Lifetime tests at the system level are expensive and time-consuming due to their high complexity. In this work, a holistic concept is presented to model batteries at the system level to decrease experimental testing effort: All components from the equivalent circuit and lumped thermal cell model with integrated semi-empirical aging model to the system model are incorporated. The electrical and thermal parameterization for each model are included. The validation is carried out with commercial cells and self-built modules.     «

Battery aging depends significantly on the operating conditions. Since these differ from cell to cell in connected systems, examining aging at the cell level is not sufficient. Lifetime tests at the system level are expensive and time-consuming due to their high complexity. In this work, a holistic concept is presented to model batteries at the system level to decrease experimental testing effort: All components from the equivalent circuit and lumped thermal cell model with integrated semi-empir...     »