Comparative Numerical Analysis of the Robustness of Si and SiC PiN Diodes Against Cosmic Radiation-induced Failure

Huang, Y.; Lechner, B.; Wachutka, G.

Title:: Comparative Numerical Analysis of the Robustness of Si and SiC PiN Diodes Against Cosmic Radiation-induced Failure
Document type:: Konferenzbeitrag
Author(s):: Huang, Y.; Lechner, B.; Wachutka, G.
Book / Congress title:: Proceedings of ICSCRM 2019
Date of congress:: 29. September- 04. Oktober
Year:: 2019
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